LD Chip Tester
This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (for optical communication) laser diodes in the bare chip state at high speed.
LD2920MTB is a measurement of "IL measurement (FRONT / BACK)", "IV measurement", "Ir, Vr measurement", "wavelength measurement" at 2 temperatures (normal temperature / low temperature or high temperature (-40 ° C to 95 ° C)). Measure the item.
Customers can add necessary items such as "OCR function", "RF high frequency superimposition", and "EA measurement" as options.
Laser diode bare chip
* Please contact us for tip size and shape.
・ 6 “Grip ring x1
・ 6 “Grip ring x3
+ NG shooter
* Gel pack support is available as an option. Please contact us.
・ Index turntable method (2 units / 2 temperatures)
・ 2 stations / TTx2TT type
Position 1: Supply, storage, gaugeing position
Position 2: Probing, measurement position
(IL measurement (FRONT / BACK), IV measurement, Ir, Vr measurement, wavelength measurement)
・ Measurement holder: 2 holdersx 2TT
Chamber test room / Supply / Discharge pass box
The measurement room has a chamber structure, and during the -40 ° C test, the inside of the tank is filled with dry air or N2 gas to prevent dew condensation. The grip ring can be taken in and out of the measurement room via the pass boxes on the left and right.
・ Needle type probe contacts top electrode, bottom electrode contacts by measurement stage.
Normal temperature / low temperature or high temperature
・ IL measurement (CW, Pulse) FRONT / BACK (normal temperature only) Simultaneous measurement
・ Ir / Vr measurement
・ Wavelength measurement: Standard compatible equipment
・ OCR character reading
・ RF high frequency superimposition
・ EA measurement