![光ファイバー](https://static.wixstatic.com/media/b815a2_fb754042a336464297046f416ed70c6c~mv2.jpg/v1/crop/x_17,y_100,w_1247,h_83/fill/w_980,h_65,al_c,q_80,usm_0.66_1.00_0.01,enc_auto/fiber-3821969_1280.jpg)
![privacy_title.jpg](https://static.wixstatic.com/media/a5fe29_53759cf0fec34d3c9b820736d878d06f~mv2.jpg/v1/crop/x_0,y_7,w_201,h_59/fill/w_221,h_65,al_c,lg_1,q_80,enc_auto/privacy_title.jpg)
Tester
![浅蓝色背景.png](https://static.wixstatic.com/media/534fc9_b1940582211f4d398a0b6c3b80c3d6e1~mv2.png/v1/fill/w_608,h_345,al_c,lg_1,q_85,enc_auto/%E6%B5%85%E8%93%9D%E8%89%B2%E8%83%8C%E6%99%AF.png)
VCSEL Probing
Wafer Tester
VWP5040A
![5040A.png](https://static.wixstatic.com/media/534fc9_5cf1596a4cfe46e9a03b729f3b92eee6~mv2.png/v1/fill/w_204,h_276,al_c,q_85,usm_0.66_1.00_0.01,enc_auto/5040A.png)
Overview
This is an LD test wafer prober that automatically measures electrical and optical characteristics in a WAFER state of a VCSEL laser diode in a normal temperature (20 ° C) to high temperature (95 ° C) environment. Mapping is performed before measurement, and IL and λ measurements are performed one by one according to the map. After measurements of the IL and λ are completed, FFP measurement and NFP measurement are performed in sequence. The auto prober can supports multi-beam VCSELs.
Test Object
Multi-beam VCSEL wafer
Wafer Mapping Function
Wafer mapping is performed at high speed before measurement.
Temperature Control Method / Range
・ Controlled by Peltier
・ 20 ℃ ~ 95 ℃
Setting Items
・ IL / IV measurement (CW)
・ Ir / Vr measurement
・ Wavelength measurement: Standard compatible equipment
Shortwave: OCEAN OPTICS HR2000 +
・ FFP measurement Far Field Pattern: 12M pixel camera Image processing method
・ NFP measurement Far Field Pattern: 12M pixel camera Image processing method