​Tester

LD Tester For Research And Development

LD342L/S -RT/LT

Overview

This device is a desktop LD test system for research and development that semi-automatically measures the electrical and optical characteristics of long-wavelength / short-wavelength laser diodes in TO-CAN, bare chip, COS, and COC states.

Test Object

TO-CAN package: φ5.6, φ9.0, bare chip, COS, COC (compatible with various jigs)

* Please contact us for other special packages. Prepare a special jig.

Long wavelength LD: L type, short wavelength LD: S type

Temperature Control Method / Range

・ Controlled by Peltier and water-cooled chillers

・ -40 ℃ ~ 95 ℃: LT type, ・ 20 ℃ ~ 95 ℃: RT type,

Setting items

Standard item

・ IL measurement (CW, Pulse)

・ FFP measurement (vertical)

・ FFP measurement (horizontal)

-IrLD / IrPD / Im (LD reverse current / PD reverse current / Im current)

・ Wavelength measurement

Long wave: ANRITSU MS9740B, YOKOGAWA AQ6360

Shortwave: YOKOGAWA AQ6373B

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