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​Tester

LD1200、LD1500

LD Tester

　　LD1200,1300 Series｜TO-CAN Auto-Handler LD Tester
LD1200_副本.png

This is a tester for inspecting, sorting and classifying the electrical and optical characteristics of TO-CAN package LD.
It is a mass-produced high-speed tester that supplies, sorts and stores are fully automatically.

        Laser：

BLUE
GREEN
RED
　　LD1500 Series｜Frame Auto-HandlerLD Tester

This is a tester for inspecting, sorting and classifying the electrical and optical characteristics of frame type LD.
It is a mass-produced high-speed tester that supplies, sorts, and stores are fully automatically.

        Laser：

RED
LD1500.PNG
　　LD2300 Series ｜LD Chip Bar Tester / Semi-auto Manual Type
LD2300_副本.png

This is a tester for inspecting the electrical and optical characteristics of the chip bar LD.

We have machines for the type of semi-automatic and manual.

        Laser：

FP
DFB

Details :

　　LD2500 Series ｜LD Chip Bar Tester / Full-Auto Type
LD2500C.png

This is a tester for inspecting the electrical and optical characteristics of the chip bar LD.

Full-automatic supply, measurement and classified storage.

        Laser：

FP
DFB
　　LD2700 Series ｜LD Chip Tester
LD2700_%E5%89%AF%E6%9C%AC_edited.png

This is a mass production  tester that inspects the electrical and optical characteristics of bare chip LD.

It is a high-speed inspection device.

Measurement, supply and classified storage are carried out automatically at 

1-2temperature(20℃～95℃）and 2-4 position.

        Laser：

DFB
FP
EML
RF
BLUE
GREEN
RED
HMV
COC、COS

Details :

　　LD2900 Series ｜LD Chip Tester
2900_edited.png

This is a mass-produced high-speed inspection tester for the electrical and optical characteristics of bare chip LD.

Measurement, supply and classified storage are carried out automatically at 1-2-3 temperature (-40 ° to 25 ° C to 95 ° C) and 2-4 position.

​

        Laser：

FP
EML
DFB
RF

Details :

　　LD3600 Series｜TO-CAN LD Temperature Environmental Tester
3600D_副本.png

LD temperature characteristics for the purpose of 3 temperature (-40 ° to 25 ° C to 95 ° C) characteristic tests of TO-CAN LD.

The CAN package and LD in the chip carrier state are mounted on a dedicated jig board, measurement and judgment are automatically performed while controlling the temperature.

        Laser：

DFB
FP
EML
RF
BLUE
GREEN
RED

Details :

　　LD3700 Series ｜TO-CAN I-L Auto-Handler LD Tester for low temperature
LD3700_副本.png

The electrical and optical characteristics of TO-CAN LD can be adjusted at 1 temperature in the range of -10 ° C ~.

It is a automatically machine.

        Laser：

FP
DFB
　　LD4200 Series ｜LD Tester for research and development

This is a tester for researching evaluation that supports LD of various packages with a special jig.
The workpiece is set manually and all items are automatically measured and judged.

        Laser：

FP
DFB
BLUE
GREEN
RED
COC、COS
LD4200.png

Details :

LD4300 Series ｜ LD Module Tester

It is an LD inspection device for research evaluation that supports LD of various packages with a special jig.
Various measurements are performed while controlling the temperature inside and outside the LD module.

        Laser：

背景.PNG

Preparation

FP
DFB
　　LD342L/S -RT/LT｜LD Tester for research and development
LD342.png

A desktop type simple LD tester for research evaluation.

It corresponds to LD of various packages with a special jig.

The workpiece is set manually and IL, λ, and FFP are measured automatically.

Selecting a combination of long wave or short wave, low temperature to high temperature or normal temperature to high temperature as specifications.

        Laser：

DFB
FP
BLUE
GREEN
RED
COC、COS
　　LD4500 Series｜LD Tester for high power type

This is a tester for high power type compatible with TO-CAN, chip bar LD, COS, etc.

        Laser：

RED
BLUE
GREEN
COC、COS
LD4500_edited.png
　　VL1000 Series｜VCSEL Package LD Tester
VL1040A.png

LD tester for VCSEL package.

The LD emission point can be detected by image processing and highly accurate measurement can be performed.

        Laser：

HMV
　　VWP5040A Series｜VCSEL Probing Wafer Tester
5040A.png

LD tester for VCSEL wafers.

Each item of IL, λ, NFP, and FFP is measured for each chip in the wafer state.

        Laser：

HMV
　　AOI1000 Series｜LD Chip Visual Inspection Machine

This is an automatic visual inspection machine for inspecting the top and end faces of LD chips.
Poor appearance of the chip while stuck to the ring sheet or gel pack

Detect

By removing defective products, only non-defective products can be left on the sheet.

        Laser：

FP
DFB
BLUE
GREEN
RED
　　IR Series｜ Package Transfer Machine
IR-1100B_edited.jpg

Transporting tray and burn-in board /

LD3600 that transfer robot that inserts / removes TO-CAN LD with a jig board.

We design equipment that meets customer specifications, such as various packages, various trays, and jig boards.

        Laser：

DFB
FP
BLUE
GREEN
RED

Details :

LD2300、LD2500
LD2700
LD3600、LD3700
LD4200、LD4300
LD342L、LD4500
VL1000、VWP5040A
AOI1000、IR
LD2900
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