This is a mass-produced high-speed inspection tester for the electrical and optical characteristics of bare chip LD.
Measurement, supply and classified storage are carried out automatically at 1-2-3 temperature (-40 ° to 25 ° C to 95 ° C) and 2-4 position.
LD temperature characteristics for the purpose of 3 temperature (-40 ° to 25 ° C to 95 ° C) characteristic tests of TO-CAN LD.
The CAN package and LD in the chip carrier state are mounted on a dedicated jig board, measurement and judgment are automatically performed while controlling the temperature.
A desktop type simple LD tester for research evaluation.
It corresponds to LD of various packages with a special jig.
The workpiece is set manually and IL, λ, and FFP are measured automatically.
Selecting a combination of long wave or short wave, low temperature to high temperature or normal temperature to high temperature as specifications.