LD Chip Tester
This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of a long-wavelength (for optical communication) bare-chip laser diode at high speed.
LD2900TB measures the measurement items of "IL measurement (FRONT / BACK)", "IV measurement", "Ir, Vr measurement", and "wavelength measurement" at a single temperature (20 ° C to 95 ° C).
Customers can add necessary items such as "OCR function", "RF high frequency superimposition", and "EA measurement" as options.
Laser diode bare chip
* Please contact us for tip size and shape.
・ 6 “Grip ring x1
・ 6 “Grip ring x2
+ NG shooter
* Gel pack support is available as an option. Please contact us.
・ Index turntable method (1 unit / temperature)
・ 2 stations / TT type
Position 1: Supply, storage, gaugeing position
Position 2: Probing, measurement position
(IL measurement (FRONT / BACK), IV measurement, Ir, Vr measurement, wavelength measurement)
・ Measurement holder: 2 holders
・ Needle type probe contacts top electrode, bottom electrode contacts by measurement stage
・ IL measurement (CW, Pulse) FRONT / BACK simultaneous measurement
・ Ir / Vr measurement
・ Wavelength measurement: Standard compatible equipment
・ OCR character reading
・ RF high frequency superimposition
・ EA measurement