​Tester

LD Chip Tester

LD2920TB

Overview

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (for optical communication) laser diodes in the bare chip state at high speed.

LD2900TB measures measurement items of "IL measurement (FRONT / BACK)", "IV measurement", "Ir, Vr measurement", and "wavelength measurement" at 2 temperatures (normal temperature / high temperature (20 ° C to 95 ° C)). 

Customers can add necessary items such as "OCR function", "RF high frequency superimposition", and "EA measurement" as options.

Test Object

Laser diode bare chip

 

* Please contact us for chip size and shape.

Supply

・ 6 “Grip ring x1

Storage

・ 6 “Grip ring x3

+ NG shooter

* Gel pack support is available as an option. Please contact us.

Measuring  Holder

・ Index turntable method (2 units / 2 temperatures)

・ 2 stations / TTx2TT type

Position 1: Supply, storage, gaugeing position

Position 2: Probing, measurement position

(IL measurement (FRONT / BACK), IV measurement, Ir, Vr measurement, wavelength measurement)

・ Measurement holder: 2 holders x 2TT

Temperature Range

・20℃~95℃

Contact Method

・ Needle type probe contacts top electrode, bottom electrode contacts by measurement stage

Setting Items

Standard items Normal temperature / high temperature

・ IL measurement (CW, Pulse) FRONT / BACK (normal temperature) simultaneous measurement

・ Ir / Vr measurement

・ Wavelength measurement: Standard compatible equipment

ANRITSU MS9740B

YOKOGAWA AQ6360

Optional items

・ OCR character reading

・ RF high frequency superimposition

・ EA measurement

Details :

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