TO-CAN LD Temperature Characteristic Test Equipment
This device is an LD test system that automatically measures the electrical and optical characteristics of a laser diode in the TO-CAN state under normal temperature (25 ° C), low temperature (-40 ° C), and high temperature (85 ° C) environments. Installing 200 elements on the jig board.
After measuring the characteristics of 200 elements at the set temperature, move to the next temperature, stabilize the temperature, and then measure 200 elements in that temperature environment. Automatic measurement is performed based on the temperature pattern specified in advance.
The measurement target can be both long wave and short wave. (Pre-designation required)
In particular, it has been highly evaluated by various companies in the industry as a long-wave (for optical communication) CAN evaluation device.
LD3600L is an enlarged version of 3600C type mounting element, and 200 jig boards x 1 set are mounted to measure items IL / IV, λ, FFP H, and FFP V.
* Please contact us for CAN shape, number of pins, and polarity arrangement.
・ 200 elements (TO-CAN) mounting jig board x1
Temperature Control Method / Range
・ Controlled by Peltier, heater, and water-cooled chiller
・ -40 ℃ ～ 95 ℃
Chamber Test Room
The measurement room has a chamber structure, and during the -40 ° C test, the inside of the tank is filled with dry air or N2 gas to prevent dew condensation.
・ IL / IV measurement (CW)
・ Ir / Vr measurement
・ FFP measurement Far Field Pattern (horizontal)
・ FFP measurement Far Field Pattern (vertical)
・ Wavelength measurement: Standard compatible equipment
Long wave: ANRITSU MS9740B, YOKOGAWA AQ6360
Shortwave: YOKOGAWA AQ6373B