​Tester

LD Chip Tester

LD2735VF

​更新中

Overview

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of a bare-chip Multi beam VCSEL at high speed. Flip chip Multi beam VCSEL (top emission, bottom 2 electrodes) and normal Multi beam VCSEL (top emission, top and bottom electrodes). It is possible to support two types of chips without replacing the holder. The measurement items are "IL / IV measurement", "wavelength measurement", and "NFP measurement".

Test Object

Flip Chip Multi Beam VCSEL Bare Chip

Multi-beam VCSEL bare chip

* CW6A, PULSE10A, 10W

Supply/Storage 

・ Supply: 6 “Grip ring x 1”

・ Storage: Bin Block x6

Measuring  Holder

・ Index turntable method (1 unit / temperature)

・ 4 stations / TT type measurement is 2 stations, supply and storage are 2 stations.

・ Measurement holder: 4 holders

Temperature range

・ 20 ℃ ~ 90 ℃

Setting Items

Standard item

・ IL / IV measurement, Ir / Vr measurement (CW, Pulse)

・ Wavelength measurement: OCEAN OPTICS Maya 2000PRO

・ NFP measurement (MULTI BEAM evaluation)

Details :

Copyright 2012 ALPHAX Co.,LTD. All rights reserved