LD Tester For Research And Development
This device is an LD test system for research and development that semi-automatically measures and selects the electrical and optical characteristics of a short wavelength laser diode in the TO-CAN state.
TO-CAN package: φ3.3, φ5.6, φ9.0
* Please contact us for other special packages.
* Supports various shapes, number of lead pins, and polarity
・ Dedicated jig x1
* Separately supports high-speed pulse jigs, etc.
・ IL measurement (CW, Pulse)
・ FFP measurement (vertical)
・ FFP measurement (horizontal)
-IrLD / IrPD / Im (LD reverse current / PD reverse current / Im current)
・ Wavelength measurement
Shortwave: YOKOGAWA AQ6373B
・ IL measurement (high-speed Pulse)
・ Polarization ratio (POL) measurement
・ Droop measurement