​Tester

High Output Type

LD Tester

LD4500DAT

Overview

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of ultra-high power lasers in COS and CHIP states.

Test Object

COS L = 3000-6000 μm, W = 3000-6000 μm

CHIP L = 2000-5000 μm, W = 300-600 μm

30A, 30W 400-1000nm

* Please contact us for detailed shapes and specifications.

Supply / Storage

COS: 2 ”gel pack x1 (supply), 2” gel pack x3 (storage)

CHIP: 6 ”grip ring x1 (supply), 6” grip ring x2 or 2 ”gel pack x3 (storage)

Temperature Control/Range

・ Controlled by Peltier and water-cooled circulation

・ 25 ℃ ~ 95 ℃

Setting Items

・ IL measurement (CW, Pulse)

・ FFP measurement (vertical) (± 45 °)

・ FFP measurement (horizontal) (± 45 °)

・ Ir / VrLD (LD reverse current, reverse voltage)

・ Wavelength measurement

Shortwave: Ocean optics HR4000

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