Tester
LD Chip Tester
LD2700
Overview
This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of a bare-chip laser diode at high speed. It is compatible with various LDs and has a large number of long wavelength and short wavelength deliveries.
We have a track record of supporting COS, COC, VCSEL, etc.
Basically, the measurement items are "IL / IV measurement" and "wavelength measurement".
Optional "FFPV, H measurement" "RF high frequency superimposition" "EA measurement" "Polarization ratio measurement" "High-speed pulse measurement"
The customer can add required items as option.
Test Object
Bare chip LD, COS, COC, VCSEL, top 2 electrodes, flip chip, etc.
* Please contact us for the shape etc.
Supply
・ 6 “Grip ring x1
・ Special tray
Storage
・ 6 "Grip ring x2 ~ 3"
・ Special tray
+ NG shooter
* Please contact us regarding the tray shape, the number of flat placements, and the number of stages of changer magazines.
Measuring Holder
・ Index turntable method (1 unit / temperature)
・ 4 stations / TT type
Measurement is up to 2-3 stations, 2 stations are used for supply and storage.
・ Measurement holder: 4 holders
Temperature Range
・20℃～95℃
Contact Method
・ The upper and lower chips contact the top electrode with a needle-type probe.
The bottom electrode is contacted by the measurement stage
・ The upper surface 2 electrode tip contacts the upper surface 2 electrode with a needle type probe.
・ Flip chip contacts 2 electrodes on the bottom surface by measurement stage
Setting Items
Standard item
・ IL / IV measurement
・ Ir / Vr measurement (CW, Pulse)
・ Wavelength measurement: Standard compatible equipment
Long wave: ANRITSU MS9740B, YOKOGAWA AQ6360
Shortwave: OCEAN OPTICS HR4000, YOKOGAWA AQ6373B
Optional items
・ FFP measurement (vertical)
・ FFP measurement (horizontal)
・ NFP measurement (MULTI BEAM evaluation, etc.)
・ OCR character reading
・ RF high frequency superimposition
・ EA measurement
Details :